PiC testing is complicated
We simplify the process
We get it. Testing integrated photonic systems is hard. Test scenarios require precise control of parameters in the optical, electrical, thermal, and mechanical domains requiring a myriad of instruments. Our probe stations automate and orchestrate the process.
A system that finds light fast and automates characterization
Maple Leaf Photonics was started by photonic engineers who needed an affordable and flexible way to test their own designs. Our probe stations automate the time-consuming repetitive tasks required for PiC testing. The platform scales from prototyping early concepts through qualifying hundreds of parts using our multi-die system. We have complete solutions for any product development stage.
Single-Die Probe Station
The SD100 is perfect for characterizing hundreds of circuits on a single device.
Multi-Die Probe Station
The MD100 automates the testing of optical circuits on many chips in a single run.
Whether it's sensing or quantum optics, we tailor systems for specific applications.
Modular by design, customized by you.
PiC designs vary widely. Test needs do too. We designed our platform with flexibility in mind. The intelligent partitioning of various hardware components, their controls, and software allow users to customize systems for their unique needs or scale their existing probe station as new test needs emerge.
We help innovators develop tomorrow's PiC products
Our customers push the boundaries of what's possible with integrated photonics and we are thrilled to be a part their success. We focus on lowering the barrier to entry and automation to help accelerate the PiC revolution.